IEEE

Active learning enhanced deep-learning surrogate model for fast MEMS design with high-dimensional design parameter spaces

Abstract: MEMS devices suffer from errors in manufacturing processes such as lithography, etching, thinning, etc. These errors cause non-negligible deviations between the actual device performance and ...
IEEE

PDF Malware Detection: Toward Machine Learning Modeling With Explainability Analysis

Abstract: The Portable Document Format (PDF) is one of the most widely used file types, thus fraudsters insert harmful code into victims’ PDF documents to compromise their equipment. Conventional ...