Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Technology Networks

Machine Learning Applications in Proteomics

Machine learning enhances proteomics by optimizing peptide identification, structure prediction, and biomarker discovery.
Visual Studio Magazine

Nearest Centroid Classification for Numeric Data Using C#

Here's a complete end-to-end demo of what Dr. James McCaffrey of Microsoft Research says is arguably the simplest possible classification technique. The goal of a machine learning classification ...
Visual Studio Magazine

Implementing k-NN Classification Using C#

Dr. James McCaffrey of Microsoft Research presents a full demo of k-nearest neighbors classification on mixed numeric and categorical data. Compared to other classification techniques, k-NN is easy to ...