AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

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News Medical

Sigma Field Emission Scanning Electron Microscopes from Carl Zeiss

Combine field emission SEM (FE-SEM) technology with advanced analytics. Profit from proven Gemini electron optics. Choose from a variety of detector options: you can image particles, surfaces, and ...
AZOM

ZEISS Sigma FE-SEM for High-Quality Imaging and Advanced Analytical Microscopy

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AZOM

Scanning Electron Microscope for Imaging and Analysis of Ceramics at Sub-Nanometer Scale

This article helps to gain insights on the development of next-generation advanced ceramics, and to better understand porous structures and sintering processes, improve production, and reduce time to ...