EDN

VLSI conference papers weigh 65-nm, new circuits

AUSTIN, Texas — While technologists look to 65-nanometer nodes, circuit designers by and large are two generations back. So it's no surprise that as a string of 65-nm papers are delivered at the 2004 ...
科学技術振興機構

Dependable SRAM Techniques for Highly Reliable VLSI System

The goal of the project is to develop design techniques for scaled SRAM to enhance a dependability of VLSI system in deep sub-deci micron era and beyond. To overcome ...
EDN

VLSI papers weigh 65 nm, new circuits

AUSTIN, Texas — While technologists look to 65-nanometer nodes, circuit designers by and large are two generations back. So it's no surprise that as a string of 65-nm papers are delivered at the 2004 ...