CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...