Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
DataStudio analytics software from NI bridges critical data across the semiconductor design and test workflow. DataStudio Specification Compliance Manager (SCM), the first application in the ...
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