How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...

Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

However, not all innovations are equal and nor do they follow a constant upward trend. Instead, their evolution takes the form of an S-shaped curve that reflects their typical lifecycle from early ...

Simulation technology is increasingly being utilised within the automotive space, saving time, money and allowing for simulated repeats of real-world scenarios again and again. Advanced Micro Devices ...