The floodgates for chiplet-based design have officially opened. Over the past several quarters, manufacturing test flows have been validating 2.5D package architectures, and production volumes are ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...