The Model 104A-1 Thermo-Probe probe tests components by applying pinpoint heat accurate to within ±1°C. Used to test devices such as diodes, resistors, and transistors, the probe takes seconds to heat ...
IC test interface solution providers, which include probe cards and IC test sockets, are engaged in price negotiations with their fabless clients as demand for wireless devices falls, according to ...
October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...
Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
LIVERMORE, Calif., July 08, 2022 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), a leading test and measurement supplier, was again ranked as the world’s number one supplier of semiconductor ...
Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...
Data centers are undergoing a dramatic transformation to reduce the power consumption of high-speed data transmissions by 70% or more with co-packaged optics. By moving optical transceivers from the ...
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