The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

CSInstruments' Galaxy Dual Controller reinvigorates existing atomic force microscopy (AFM) systems, turning AFMs like the MultiMode, 5100, and 5500, into cutting-edge instruments for advanced research ...

Atomic force microscopy (AFM) systems such as the MultiMode, 5100, and 5500 are transformed into state-of-the-art tools for cutting-edge research with CSInstruments' Galaxy Dual Controller. Whether in ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy The Nexus system reliably ...

Bruker Corporation BRKR recently launched the Dimension Nexus atomic force microscope (AFM) at the 2024 MRS Fall Meeting & Exhibit. Dimension Nexus comes with the latest-generation NanoScope 6 ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...

“We already have a number of Bruker AFMs in our open-access user facilities and are always looking for new technology that can further support the many researchers we serve from both academia and ...

May 16, 2014. Agilent Technologies Inc. has introduced its AFM-enabled scanning electrochemical microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform ...

PISCATAWAY, NJ — March 4, 2025 — HORIBA, a global leader in analytical and measurement technologies, proudly announces the launch of the SignatureSPM™, a new, multimodal characterization system built ...